Wafer Level Reliability (WLR) Software 21.0: Enhance Reliability Throughput with WLR Software & SMUs

Shrinking device geometries and expanding quality requirements are forcing semiconductor companies to analyze more reliability data than ever before. NI’s Wafer Level Reliability (WLR) Solution provides faster insight with industry-leading channel density, parallelism, and measurement speed. The video shows the latest release of our WLR Software 21.0 API and how to quickly evaluate NI’s WLR solution with our TDDB and BTI/HCI example programs. With this software, users can more easily adapt their reliability setups to create the flexibility they need for the business demands their organization has.