Wafer Level Reliability: Enhance your reliability decisions with interactive WLR software & SMUs

Shrinking device geometries and expanding quality requirements are forcing semiconductor companies to analyze more reliability data than ever before. NI’s Wafer Level Reliability (WLR) Solution provides faster insight with industry-leading channel density, parallelism, and measurement speed. The video shows our interactive application software along our high-performance SMUs that can scale to meet your throughput requirements.